ある日、ブルースクリーンが浮かんでウィン7がクラッシュすることがありましたが、バッテリーがほとんどなくなって電源問題だと思って交換し、Linuxデュアルブートをインストールしたのに問題はありませんでした。また、winとlinux、linuxでは、busyboxの破損したセクタが非常に頻繁に発見されたため、HDDがすぐに死んだ場合、突然発生しました。 Smartctlテストを実行しましたが、「Normal」とマークされていますが、悪くなり、HDDはwas起動中に表示されず、時々表示されません。 LinuxMintを新しくインストールしましたが、何も変更されませんでしたが、起動時に悪くなりました...とにかく
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-74-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MQ01ABF...
Device Model: TOSHIBA MQ01ABF050
Serial Number: Y4NOTF2ST
LU WWN Device Id: 5 000039 5e1b88b6e
Firmware Version: AM0P1D
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Mar 23 19:17:04 2022 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 116) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 128
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1083
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
9 Power_On_Hours 0x0032 076 076 000 Old_age Always - 9908
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4249
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 189
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 133
193 Load_Cycle_Count 0x0032 089 089 000 Old_age Always - 112315
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 37 (Min/Max 21/55)
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 136059899
200 Multi_Zone_Error_Rate 0x0032 100 100 000 Old_age Always - 497385650
240 Head_Flying_Hours 0x0032 077 077 000 Old_age Always - 9579
241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 39725304303
242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 54450583368
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 810 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 810 occurred at disk power-on lifetime: 9908 hours (412 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 50 f0 10 09 00 40 240 sectors at LBA = 0x00000910 = 2320
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 09 00 40 00 00:02:24.559 READ DMA EXT
aa aa aa aa aa aa aa ff 00:02:24.553 [RESERVED]
25 00 01 00 08 00 40 00 00:02:24.484 READ DMA EXT
aa aa aa aa aa aa aa ff 00:02:24.478 [RESERVED]
25 00 40 00 08 00 40 00 00:02:24.338 READ DMA EXT
Error 809 occurred at disk power-on lifetime: 9908 hours (412 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 50 20 20 08 00 40 32 sectors at LBA = 0x00000820 = 2080
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 00 08 00 40 00 00:02:24.338 READ DMA EXT
aa aa aa aa aa aa aa ff 00:02:24.264 [RESERVED]
25 00 00 00 09 00 40 00 00:02:24.186 READ DMA EXT
aa aa aa aa aa aa aa ff 00:02:24.175 [RESERVED]
25 00 01 00 08 00 40 00 00:02:24.101 READ DMA EXT
Error 808 occurred at disk power-on lifetime: 9908 hours (412 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 50 20 20 08 00 40 32 sectors at LBA = 0x00000820 = 2080
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 00 08 00 40 00 00:02:24.023 READ DMA EXT
25 00 01 00 08 00 40 00 00:02:23.944 READ DMA EXT
aa aa aa aa aa aa aa ff 00:02:23.934 [RESERVED]
25 00 40 00 08 00 40 00 00:02:23.856 READ DMA EXT
25 00 c0 40 06 10 40 00 00:02:23.856 READ DMA EXT
Error 807 occurred at disk power-on lifetime: 9908 hours (412 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 50 10 30 08 00 40 16 sectors at LBA = 0x00000830 = 2096
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 00 08 00 40 00 00:02:23.856 READ DMA EXT
25 00 c0 40 06 10 40 00 00:02:23.856 READ DMA EXT
25 00 40 00 06 10 40 00 00:02:23.855 READ DMA EXT
25 00 00 00 07 10 40 00 00:02:23.852 READ DMA EXT
25 00 c0 40 04 10 40 00 00:02:23.852 READ DMA EXT
Error 806 occurred at disk power-on lifetime: 9908 hours (412 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 50 b0 50 09 00 40 176 sectors at LBA = 0x00000950 = 2384
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 09 00 40 00 00:02:23.660 READ DMA EXT
25 00 40 00 00 00 40 00 00:02:23.633 READ DMA EXT
25 00 3c 38 10 00 40 00 00:02:22.542 READ DMA EXT
ec 00 00 00 00 00 00 00 00:02:22.541 IDENTIFY DEVICE
b1 c1 00 00 00 00 00 00 00:02:22.540 DEVICE CONFIGURATION FREEZE LOCK [OBS-ACS-3]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 9906 -
# 2 Short offline Aborted by host 40% 9906 -
# 3 Short offline Completed without error 00% 9764 -
# 4 Short offline Interrupted (host reset) 60% 9763 -
# 5 Short offline Completed without error 00% 8985 -
# 6 Short offline Completed without error 00% 2007 -
# 7 Short offline Completed without error 00% 1377 -
# 8 Short offline Completed without error 00% 1377 -
# 9 Short offline Completed without error 00% 1334 -
#10 Short offline Completed without error 00% 1246 -
#11 Short offline Completed without error 00% 4 -
#12 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
smartctlの結果ですが、ハードを交換する必要がありますか？
答え1
ドライブはよく見えますが（まだ実行することをお勧めしますsudo smartctl -t long /dev/device。数時間かかることがあります）、UDMA_CRC_Error_Count速度は非常に高速です。 SATAケーブルを交換し、純粋なアルコールで接触パッドを清掃してください。